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Design for Testability, Debug and Reliability
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Design for Testability, Debug and Reliability

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

Undertittel
Next Generation Measures Using Formal Techniques
Opplag
2021 ed.
ISBN
9783030692117
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
20.4.2022
Antall sider
164