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Delay Fault Testing for VLSI Circuits
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Delay Fault Testing for VLSI Circuits

In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech­ niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Forfatter
Angela Krstic
Opplag
Softcover reprint of the original 1st ed. 1998
ISBN
9781461375616
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
12.10.2012
Antall sider
191