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Defects in HIgh-k Gate Dielectric Stacks
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Defects in HIgh-k Gate Dielectric Stacks

Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-K Dielectric Nano-Electronic Semiconductor Devices, St. Petersburg, Russia, from 11 to 14 July 2005.
Undertittel
Nano-Electronic Semiconductor Devices
Redaktør
Evgeni Gusev
Opplag
2006 ed.
ISBN
9781402043659
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
27.1.2006
Antall sider
492