Gå direkte til innholdet
Defects and Properties of Semiconductors
Spar

Defects and Properties of Semiconductors

Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication.
Undertittel
Defect Engineering
Opplag
Softcover reprint of the original 1st ed. 1987
ISBN
9789401086165
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
25.12.2011
Forlag
Springer
Antall sider
300