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Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing
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Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing

Forfatter:
Engelsk
Undertittel
Decreasing of Defects of MBE Grown CdTe F¿lms by Ex-Situ Annealing as a Buffer Layer for MCT IR Detector Applications
Forfatter
Emine Bakali
ISBN
9783639814569
Språk
Engelsk
Vekt
185 gram
Utgivelsesdato
22.10.2016
Forlag
TAK
Antall sider
112