Spar
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Forfatter:
heftet, 2010
Engelsk
Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc.
- Forfatter
- Manoj Sachdev, José Pineda de Gyvez
- Opplag
- Softcover reprint of hardcover 2nd ed. 2007
- ISBN
- 9781441942852
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 10.11.2010
- Antall sider
- 328
