Gå direkte til innholdet
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Spar

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc.
Opplag
2nd ed. 2007
ISBN
9780387465463
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
21.6.2007
Antall sider
328