
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
- Undertittel
- Process-Aware SRAM Design and Test
- Forfatter
- Andrei Pavlov, Manoj Sachdev
- Opplag
- Softcover reprint of hardcover 1st ed. 2008
- ISBN
- 9789048178551
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 28.10.2010
- Forlag
- Springer
- Antall sider
- 194
