Spar
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Forfatter:
innbundet, 2008
Engelsk
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
- Undertittel
- Process-Aware SRAM Design and Test
- Forfatter
- Andrei Pavlov, Manoj Sachdev
- Opplag
- 2008 ed.
- ISBN
- 9781402083624
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 21.6.2008
- Antall sider
- 194
