Gå direkte til innholdet
CMOS Plasma and Process Damage
Spar

CMOS Plasma and Process Damage

Forfatter:
innbundet, 2025
Engelsk
Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.
Forfatter
Kirk Prall
ISBN
9783031890284
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
17.5.2025
Antall sider
466