Spar
Charged Semiconductor Defects
Forfatter:
heftet, 2010
Engelsk
“Charged Defects in Semiconductors” details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
- Undertittel
- Structure, Thermodynamics and Diffusion
- Forfatter
- Edmund G. Seebauer, Meredith C. Kratzer
- Opplag
- Softcover reprint of hardcover 1st ed. 2009
- ISBN
- 9781849968201
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 22.10.2010
- Forlag
- Springer London Ltd
- Antall sider
- 298
