Spar
Charged Semiconductor Defects
Forfatter:
innbundet, 2008
Engelsk
“Charged Defects in Semiconductors” details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
- Undertittel
- Structure, Thermodynamics and Diffusion
- Forfatter
- Edmund G. Seebauer, Meredith C. Kratzer
- Opplag
- 2009 ed.
- ISBN
- 9781848820586
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 1.12.2008
- Forlag
- Springer London Ltd
- Antall sider
- 298
