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Characterization of Crystal Growth Defects by X-Ray Methods
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Characterization of Crystal Growth Defects by X-Ray Methods

This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979.
Forfatter
B.K. Tanner
Opplag
Softcover reprint of the original 1st ed. 1980
ISBN
9781475711288
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
16.12.2012
Antall sider
589