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Characterisation of Radiation Damage by Transmission Electron Microscopy
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Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
- Forfatter
- M.A Kirk, M.L Jenkins
- ISBN
- 9781420034646
- Språk
- Engelsk
- Utgivelsesdato
- 21.11.2000
- Forlag
- CRC PRESS
- Tilgjengelige elektroniske format
- PDF - Adobe DRM
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- E-bokleser i mobil/nettbrett
- Lesebrett
- Datamaskin
