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Built-in-Self-Test and Digital Self-Calibration for RF SoCs
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
Opplag
2012
ISBN
9781441995476
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
22.9.2011
Antall sider
89