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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.
Undertittel
A User-Oriented Guide
Opplag
2013 ed.
ISBN
9783642273803
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
25.10.2012
Antall sider
528