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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Opplag
2011 ed.
ISBN
9781461428572
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
28.5.2013
Antall sider
110