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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

innbundet, 2011
Engelsk
This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
ISBN
9781441978165
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
19.4.2011
Antall sider
110