Spar
Atomic Force Microscopy/Scanning Tunneling Microscopy 2
innbundet, 1997
Engelsk
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command.
- Redaktør
- Samuel H. Cohen, Marcia L. Lightbody
- Opplag
- 1997 ed.
- ISBN
- 9780306455964
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 30.4.1997
- Antall sider
- 250
