Spar
Atomic Force Microscopy in Adhesion Studies
e-bok, 2005
Engelsk
Les i Adobe DRM-kompatibelt e-bokleserDenne e-boka er kopibeskyttet med Adobe DRM som påvirker hvor du kan lese den. Les mer
Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, an
- Redaktør
- Kash L. Mittal, J. Drelich
- ISBN
- 9789047416463
- Språk
- Engelsk
- Utgivelsesdato
- 1.10.2005
- Forlag
- CRC PRESS
- Tilgjengelige elektroniske format
- PDF - Adobe DRM
- Les e-boka her
- E-bokleser i mobil/nettbrett
- Lesebrett
- Datamaskin
