Spar
Atomic Force Microscopy Based Nanorobotics
Forfatter:
heftet, 2014
Engelsk
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
- Undertittel
- Modelling, Simulation, Setup Building and Experiments
- Forfatter
- Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti
- Opplag
- 2012 ed.
- ISBN
- 9783642445019
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 26.11.2014
- Antall sider
- 344
