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Atomic Force Microscopy Based Nanorobotics
Forfatter:
innbundet, 2011
Engelsk
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
- Undertittel
- Modelling, Simulation, Setup Building and Experiments
- Forfatter
- Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti
- Opplag
- 2011
- ISBN
- 9783642203282
- Språk
- Engelsk
- Vekt
- 446 gram
- Utgivelsesdato
- 28.9.2011
- Antall sider
- 344
