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Applied Scanning Probe Methods III
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Applied Scanning Probe Methods III

innbundet, 2006
Engelsk
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
Undertittel
Characterization
Opplag
2006 ed.
ISBN
9783540269090
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
22.2.2006
Antall sider
378