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Applied Scanning Probe Methods II
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Applied Scanning Probe Methods II

innbundet, 2006
Engelsk
These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
Undertittel
Scanning Probe Microscopy Techniques
ISBN
9783540262428
Språk
Engelsk
Vekt
446 gram
Utgivelsesdato
21.2.2006
Antall sider
420