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Analytical Techniques for Thin Films
e-bok, 2013
Engelsk
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Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.
- Undertittel
- Treatise on Materials Science and Technology, Vol. 27
- Redaktør
- K. N. Tu, R. Rosenberg
- ISBN
- 9781483218311
- Språk
- Engelsk
- Utgivelsesdato
- 22.10.2013
- Forlag
- ELSEVIER SCIENCE
- Tilgjengelige elektroniske format
- PDF - Adobe DRM
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