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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Forfatter:
Engelsk
375,-
Forfatter
Sarah Fearn
ISBN
9781681747385
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
16.10.2015
Antall sider
68