Spar
Advanced Test Methods for SRAMs
heftet, 2014
Engelsk
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.
- Undertittel
- Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
- Opplag
- 2010 ed.
- ISBN
- 9781489983145
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 3.9.2014
- Antall sider
- 171
