Spar
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Forfatter:
heftet, 2013
Engelsk
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
- Forfatter
- Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
- Opplag
- Softcover reprint of the original 1st ed. 1986
- ISBN
- 9781475790290
- Språk
- Engelsk
- Vekt
- 310 gram
- Utgivelsesdato
- 8.6.2013
- Antall sider
- 454
