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Acoustic Scanning Probe Microscopy
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Acoustic Scanning Probe Microscopy

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave.
Opplag
2013 ed.
ISBN
9783642430794
Språk
Engelsk
Vekt
310 gram
Utgivelsesdato
9.11.2014
Antall sider
494