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Yield and Variability Optimization of Integrated Circuits
Tallenna

Yield and Variability Optimization of Integrated Circuits

129,70 €
Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications.
Painos
Softcover reprint of the original 1st ed. 1995
ISBN
9781461359357
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
2.11.2012
Sivumäärä
234