Siirry suoraan sisältöön
  1. Kirjat
  2. Tietokirjallisuus
  3. Tiede ja tekniikka

Yield and Reliability in Microwave Circuit and System Design

Sidottu, 1993
englanti
136,90 €

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

ISBN
9780890065273
Kieli
englanti
Paino
611 grammaa
Julkaisupäivä
1.12.1993
Sivumäärä
300

Yield and Reliability in Microwave Circuit and System Design - Meehan Michael D., Purviance John - Sidottu (9780890065273) | Adlibris kirjakauppa