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X-Ray Structure Analysis
Tallenna

X-Ray Structure Analysis

Kirjailija:
englanti

This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed.

Kirjailija
Theo Siegrist
ISBN
9783110610703
Kieli
englanti
Paino
418 grammaa
Julkaisupäivä
22.11.2021
Kustantaja
De Gruyter
Sivumäärä
250