
X-Ray Structure Analysis
This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed.
- Kirjailija
- Theo Siegrist
- ISBN
- 9783110610703
- Kieli
- englanti
- Paino
- 418 grammaa
- Sarja
- De Gruyter Textbook
- Julkaisupäivä
- 22.11.2021
- Kustantaja
- De Gruyter
- Sivumäärä
- 250