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X-Ray Multiple-Wave Diffraction
Tallenna

X-Ray Multiple-Wave Diffraction

This comprehensive text describes the fundamentals of x-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical approaches and application methods for many materials, including macromolecular crystals, thin films, semiconductors, quasicrystals and nonlinear optical materials. x-ray optics is also addressed. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in x-ray diffraction.
Alaotsikko
Theory and Application
Kirjailija
Shih-Lin Chang
Painos
Softcover reprint of hardcover 1st ed. 2004
ISBN
9783642059476
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
5.12.2010
Sivumäärä
436