Tallenna
X-Ray Microscopy II
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987.
- Alaotsikko
- Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987
- Toimittaja
- David Sayre, Malcolm Howells, Janos Kirz, Harvey Rarback
- Painos
- Softcover reprint of the original 1st ed. 1988
- ISBN
- 9783662144909
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 3.10.2013
- Sivumäärä
- 455
