Tallenna
X-Ray Microscopy and Spectromicroscopy
nidottu, 2014
englanti
This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996.
- Alaotsikko
- Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996
- Toimittaja
- Jürgen Thieme, Günter Schmahl, Dietbert Rudolph, Eberhard Umbach
- Painos
- 1998 ed.
- ISBN
- 9783642721083
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 23.8.2014
- Sivumäärä
- 383
