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X-Ray Diffraction by Disordered Lamellar Structures
Tallenna

X-Ray Diffraction by Disordered Lamellar Structures

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.
Alaotsikko
Theory and Applications to Microdivided Silicates and Carbons
Kääntäjä
R. Setton
Painos
Softcover reprint of the original 1st ed. 1990
ISBN
9783642748042
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
13.12.2011
Sivumäärä
371