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Wavelet Analysis and Multiresolution Methods
Tallenna

Wavelet Analysis and Multiresolution Methods

This volume contains papers selected from the Wavelet Analysis and Multiresolution Methods Session of the AMS meeting held at the University of Illinois at Urbana-Champaign. The contributions cover: construction, analysis, computation and application of multiwavelets; scaling vectors; nonhomogenous refinement; mulivariate orthogonal and biorthogonal wavelets; and other related topics.
Kirjailija
Tian-Xiao He
ISBN
9780824704179
Kieli
englanti
Paino
730 grammaa
Julkaisupäivä
5.5.2000
Kustantaja
CRC Press Inc
Sivumäärä
400