Tallenna
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
nidottu, 2013
englanti
As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology.
- Alaotsikko
- Tübingen, September 9th–14th, 1968
- Toimittaja
- Gottfried Möllenstedt, K.H. Gaukler
- Painos
- Softcover reprint of the original 1st ed. 1969
- ISBN
- 9783662121108
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 20.11.2013
- Sivumäärä
- 612
