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VLSI Design and Test
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VLSI Design and Test

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Alaotsikko
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Painos
2013 ed.
ISBN
9783642420238
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
10.12.2013
Sivumäärä
388