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Trap Level Spectroscopy in Amorphous Semiconductors
Tallenna

Trap Level Spectroscopy in Amorphous Semiconductors

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.
ISBN
9780323165037
Kieli
englanti
Paino
250 grammaa
Julkaisupäivä
14.6.2010
Sivumäärä
128