
Thin-Film Capacitors for Packaged Electronics
-Novel insights into fundamental relationships between dielectric constant and the breakdown field of materials and related capacitance density and breakdown voltage of capacitor structures,
-Electrical characterization techniques for a wide range of frequencies (1 kHz to 20 GHz),
-Process modeling to determine stable operating points,
-Prevention of metal (Cu) diffusion into the dielectric,
-Measurements and modeling of the dielectric micro-roughness.
- Kirjailija
- Jain Pushkar, Eugene J. Rymaszewski
- Painos
- Softcover reprint of the original 1st ed. 2004
- ISBN
- 9781461348085
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 23.2.2014
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 158