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Thermal Testing of Integrated Circuits
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Thermal Testing of Integrated Circuits

Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Testing of circuits has become an essential process in IC manufacturing, in the effort to ensure that the manufactured components have the appropriate levels of quality.
Painos
Softcover reprint of the original 1st ed. 2002
ISBN
9781441952875
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
21.9.2011
Sivumäärä
204