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Theoretical Concepts of X-Ray Nanoscale Analysis
Tallenna

Theoretical Concepts of X-Ray Nanoscale Analysis

The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.
Alaotsikko
Theory and Applications
Painos
Softcover reprint of the original 1st ed. 2014
ISBN
9783662520543
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
27.8.2016
Sivumäärä
318