Tallenna
Testing and Reliable Design of CMOS Circuits
Kirjailija:
nidottu, 2011
englanti
In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing.
- Kirjailija
- Niraj K. Jha, Sandip Kundu
- Painos
- Softcover reprint of the original 1st ed. 1990
- ISBN
- 9781461288183
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 26.9.2011
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 232
