Tallenna
Testing and Diagnosis of Analog Circuits and Systems
Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.
- Kirjailija
- Ruey-Wen Liu
- Painos
- Softcover reprint of the original 1st ed. 1991
- ISBN
- 9781461597490
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 8.3.2012
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 284
