Testability Concepts for Digital ICs
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Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on.
- Alaotsikko
- The Macro Test Approach
- Kirjailija
- F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen
- Painos
- 1995
- ISBN
- 9781461360049
- Kieli
- englanti
- Paino
- 281 grammaa
- Julkaisupäivä
- 4.10.2012
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 212
