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Test Generation of Crosstalk Delay Faults in VLSI Circuits
Tallenna

Test Generation of Crosstalk Delay Faults in VLSI Circuits

The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
Painos
Softcover Reprint of the Original 1st 2019 ed.
ISBN
9789811347849
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
21.12.2018
Sivumäärä
156