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Test Generation of Crosstalk Delay Faults in VLSI Circuits
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Test Generation of Crosstalk Delay Faults in VLSI Circuits

sidottu, 2018
englanti
The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.
Painos
2019 ed.
ISBN
9789811324925
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
10.10.2018
Sivumäärä
156