
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.
- Toimittaja
- Jose Luis Huertas Díaz
- Painos
- 1st ed. Softcover of orig. ed. 2004
- ISBN
- 9781441954220
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 7.12.2010
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 298