Siirry suoraan sisältöön
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Tallenna

Test and Design-for-Testability in Mixed-Signal Integrated Circuits

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.

Painos
1st ed. Softcover of orig. ed. 2004
ISBN
9781441954220
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
7.12.2010
Sivumäärä
298