Siirry suoraan sisältöön
Surface Microscopy with Low Energy Electrons
Surface Microscopy with Low Energy Electrons
Tallenna

Surface Microscopy with Low Energy Electrons

Lue Adobe DRM-yhteensopivassa e-kirjojen lukuohjelmassaTämä e-kirja on kopiosuojattu Adobe DRM:llä, mikä vaikuttaa siihen, millä alustalla voit lukea kirjaa. Lue lisää
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Kirjailija
Ernst Bauer
ISBN
9781493909353
Kieli
englanti
Julkaisupäivä
10.7.2014
Formaatti
  • PDF - Adobe DRM
Lue e-kirjoja täällä
  • Lue e-kirja mobiililaitteella/tabletilla
  • Lukulaite
  • Tietokone